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LEDIA TWIN 直接描画装置 カタログ rin

The most ideal direct imaging equipment
for various semiconductor package substrates
by starting with FC-CSP

NEW ReleaseLarge sizes

We also offer models* in sizes of up to 32 inches that retain the exposure quality of smaller sizes. These variants are also suitable for use in applications that involve metal masks that demand high render precision and large-format materials such as probe circuit boards.

*LI-7F-L

The finest imaging quality

Effectiveness at higher resolution

Curve pattern getting smoother

Samples

  • L/S = 50/50μm

    L/S = 50/50μm

    *This is a limited sample exposed under the conditions, whitch specified By SCREEN

  • L/S = 40/40μm

    L/S = 40/40μm


  • L/S = 8/8μm

    L/S = 8/8μm

    *This is a limited sample exposed under the conditions, whitch specified By SCREEN

  • L/S = 7/7μm

    L/S = 7/7μm


  • 8μm line

    8μm line

    *This is a limited sample exposed under the conditions, whitch specified By SCREEN

  • 7μm line

    7μm line


  • SRO = 80μm

    SRO = 8μm

    *This is a limited sample exposed under the conditions, whitch specified By SCREEN

  • SRO = 40μm

    SRO = 40μm

New function! Design matching, enabling highly accurate alignment!

Can be used even if it is not a Point symmetric figure and Any pattern can be used as an alignment mark.

  • Design matching
  • Design matching

3 wavelengths LED technology

3 wavelength LEDs technology

Precise quality control by flexible wavelength mixture technology

3 wavelength LED technology

Easy to optimize best condition for every material with exposure power control

Various alignment method

Scan alignment

  • マーク撮影時に
    ステージを止めない

    SRO = 8μm
  • ステージの往路・復路で
    マークを撮像する

    SRO = 8μm
  • 隣りのマークもカメラ視野に
    入れる場合一度に撮像

    SRO = 8μm

Further speed-up will be possible by using simultaneous reading of neighbor marks

Alignment algorithm

  • Global

    短形補正

    Rectangle

  • Multiple points & Whole area

    線形補正 曲線補正

    Linear

    Curvw

  • Mark sharing

    短形補正

    Sharing alignment mark

  • Multiple points & Individual area

    短形補正 線形補間

    Rectangle

    Linear

Variety of algorithms achieve optimal alignment

Auto-focus function

Auto-focus and measures for panel warpage

  • Auto-focus
  • Mechanical clamping unit
  • Auto switching for suction area
オートキャリブレーション機能

Supporting board warpage response with auto-focus function and optional mechanism

The idea of automation

  • Start
  • Change over time
  • After calibration
オートキャリブレーション機能

*Calibrate the alignment camera in the same way

Achieving accurate patterning without stopping machine by manual adjustment

The idea of automation

Barcode function

  • バーコード対応

    Single side auto type

  • バーコード対応

    Double side auto type

Traceability control

Compatible with various barcodes

  • 1D code

    1Dコード
  • 2D code

    2Dコード 2Dコード

Achieving high traceability of the entire manufacturing process

2D code imaging function

2D code can be added not only to the board but also to each piece

Automation

The idea of automation ...

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Necessary information for automation

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Job data and linked Recipe

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Production info linked to the board

Achieving the idea of automation in exposure process