Automatic Optical Inspection System
Advanced line-up to meet coming LVH
inspection demand
Full support for LVH Total Inspection
Applied for various materials and processes
Applied for various materials and processes
Precise measurement inspection
Various detection logic / sensitivity settings
Fully equipped analysis function
Visualized the shift amount of entire LVH!
Yield improvement through defect collection and analysis
A wide range of materials or processes can be accurately inspected with a multi-angle line/dome illumination system.
MIYABI can inspect with a suitable illumination setting for various processes such as CU-direct / Resin-direct and after desmear / after flash-etching.
Precise measurement inspection can be provided by using our own VMeT algorithm, which can perform for entire LVH at high speed.
It does not only detects smear remaining but also realizes quantitative control of LVH's top diameter and bottom diameter as well as the roundness, that is often required for your advanced process control.
Measurement of outer shape as LVH top
Measurement of inner shape as LVH bottom
Proprietary software tools enable thorough analysis of individual boards. Along with CSV files, analysis reports can be output as images for printing, enabling immediate use.
Defect Collection Software for process and quality improvement.
Sentflow's entry package is bundled.
Providing a resource for report with defect images.
